alpha300 A AFM Microscope

Nanoscale surface characterisation   

WITec alpha300 A Atomic Force Microscope   

Features

• Surface characterisation on the nm scale
• Lateral resolution: down to 1 nm
• Depth resolution: < 0.3 nm
• Precise TrueScan™ controlled stages with scan ranges of:
  • 30 x 30 x 20 µm
  • 100 x 100 x 20 µm
  • 200 x 200 x 20 µm
• Comes with wide range of AFM modes
• Unique cantilever technology for easy exchange and alignment
• Operates in air or liquid
• Non-destructive imaging technique with minimal, if any, sample preparation
• Add confocal Raman imaging and Nearfield-Microscopy (SNOM)later if required

The alpha300 A Atomic Force Microscope is a reliable, high-quality nano-imaging system integrated with a research-grade optical microscope. It provides superior optical access, easy cantilever alignment, and high-resolution sample surveying.

These AFMs have been designed by WITec to work in combination with other imaging techniques, such as confocal Raman imaging. In fact all imaging techniques can be integrated within the same microscope system... its just a simple matter of rotating the microscope's turret to switch between the different methods.

WITec offer the following possible combinations with AFM: luminescence, fluorescence, polarisation analysis, bright field, dark field, SNOM, and Raman imaging.

Application examples from l to r: AFM topography image of a woodlouse sternal plate; Magnetic Force Measurement of PC hard disk; and digital Pulsed Force Mode image of fossilised bacteria

Operation Modes

• Contact Mode & Lift Mode™
• AC Mode (Intermittent Mode, Phase Imaging)
• Digital Pulsed Force Mode (DPFM)
• Magnetic Force Microscopy (MFM)
• Electrostatic Force Microscopy (EFM)
• Force Distance Curves
• Lithography
• Lateral Force Microscopy (LFM)
• Kelvin Probe Microscopy
• Chemical Force Microscopy (CFM)
• Custom modes on request

Microscope specification

• Research grade inverted optical microscope with 6x objective turret
• Colour video system
• LED white-light source for Köhler illumination of tip and sample
• Manual sample positioning in x- and y-direction
• Various piezo-driven scan stages with full capacitive feedback control
• Active vibration isolation system

Need stability?

Active Vibration Control Products     Passive Vibration Control Products

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