alpha300 RA Raman AFM Microscope

Combined chemical and nanoscale structural imaging in one system   

WITec alpha300 RA Raman AFM Microscope   

Features

• Combines alpha300 R (Raman) and alpha300 A (AFM) into one microscope
• Ideally suited for simultaneous Raman-AFM measurements
• Strictly correlative: moving the sample between the measurements not necessary
• Switch between the measurement techniques by rotating the objective turret
• AFM provides surface characterisation on the nm scale...
• ...Raman delivers chemical imaging of the same surface

Although the alpha300 RA was the first integrated Raman AFM system on the market, it continues to set the standard for combined instrument configurations for correlative Raman-AFM microscopy.

The alpha300 RA incorporates the features of the alpha300 R Raman microscopy system for powerful chemical imaging, and adds the Atomic Force Microscopy of the alpha300 A for high-resolution nanoscale surface characterisation. This correlative Raman AFM imaging technique can deliver a comprehensive examination of a sample.

Combined Raman-AFM measurement of the same sample area of a multicomponent polymer blend

Switching between the imaging techniques requires just a turn of the objective turret, and the easy to use software automatically adjusts the imaging parameters so that the same sample area is inspected.

The alpha300 RA is also ideally suited for TERS (Tip Enhanced Raman Spectroscopy) whereby the Raman spectrum is mostly obtained from molecules a few tens of nanometres away from the AFM tip. A flexible sample illumination from either above, below, or from the side is an additional advantage.

Raman Operation Modes

• Raman spectral imaging: acquisition of a complete Raman spectra at every image pixel
• Planar (x-y-direction) and depth scans (z-direction) with manual sample positioning
• Fibre-coupled UHTS spectrometer specifically designed for Raman and low light applications
• Image stacks: 3D confocal Raman imaging
• Time series
• Single point Raman spectrum acquisition
• Single-point depth profiling
• Confocal Fluorescence Microscopy
• Bright Field Microscopy

AFM Operation Modes

• Contact Mode & Lift Mode™
• AC Mode (Intermittent Mode, Phase Imaging)
• Digital Pulsed Force Mode (DPFM)
• Magnetic Force Microscopy (MFM)
• Electrostatic Force Microscopy (EFM)
• Force Distance Curves
• Nano-Manipulation/Lithography
• Lateral Force Microscopy (LFM)
• Kelvin Probe Microscopy
• Chemical Force Microscopy (CFM)
• Current Sensing Mode

Microscope specification

• Research grade optical microscope with 6x objective turret
• CCD camera video system
• High sensitivity monochrome video feed of sample & AFM tip in transmission
• LED white-light source for Köhler illumination of AFM tip and sample
• Manual sample positioning in x- and y-direction
• Fibre coupling
• Sample size: 120 mm (x- & y-axes), 25 mm in z-axis
• Active vibration isolation system

Need stability?

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