Menu
Your Cart

Raman Imaging of Semiconducting Materials

Raman Imaging of Semiconducting Materials
New product Contact Us
Raman Imaging of Semiconducting Materials
  • Stock: Contact us for details
  • Click here to: Contact us
  • Model: Application-Multiple-05
£0.00

Characterising crystallinity, topography, stress and other properties   

Raman Imaging of Semiconducting Materials   

Raman Imaging of Semiconducting Materials

Measuring semiconductors like silicon, gallium nitride or molybdenum disulphide using 2D and 3D Raman imaging in combination with other techniques, such as atomic force microscopy (AFM); scanning electron microscopy (SEM) and second or third harmonic generation (SHG, THG) microscopy, can reveal information on crystallinity, topography, stress fields and other material properties.

There are no downloads for this product.