WITec has recently authored a paper on the Raman Imaging of Semiconducting Materials. It details how measuring semiconductors like silicon, gallium nitride or molybdenum disulphide using 2D and 3D Raman imaging in combination with other techniques, such as atomic force microscopy (AFM); scanning electron microscopy (SEM) and second or third harmonic generation (SHG, THG) microscopy, can reveal information on crystallinity, topography, stress fields and other material properties.