Materials Science Applications
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Brand: WITec
Model: Application-Multiple-01
Survey, categorise, analyse, quantify and identify particles over large sample areas
Automated particle analysis with ParticleScout
Automated particle analysis with ParticleScout
High-resolution measurements of particles, such as ..
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Brand: WITec
Model: Application-Archaeology-02
Large-scale micron-order 3D surface correlative chemical imaging of ancient Roman concrete
Chemical imaging of ancient Roman concrete
Large-scale micron-order 3D surface correlative chemical imaging of ancient Roman concrete
There..
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Brand: WITec
Model: Application-Multiple-02
Raman technique reveals the molecular characteristics of 2D materials
Correlative Confocal Raman Microscopy for 2D Materials Investigation
Correlative Confocal Raman Microscopy for 2D Materials Investigation
Confocal Raman imaging..
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Brand: WITec
Model: Application-Materials-07
AFM and confocal Raman imaging opens new avenues for the analysis of advanced polymeric materials
Correlative Raman Imaging of Polymeric Materials
Correlative Raman Imaging of Polymeric Materials
Conventional characterisation tech..
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Brand: WITec
Model: Application-Multiple-04
Revealing changes in lattice structures due to strain
High-Resolution 3D Confocal Raman Imaging for Group III Nitrides
High-Resolution 3D Confocal Raman Imaging for Group III Nitrides
Structured substrates are widely employed in s..
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Brand: WITec
Model: Application-Materials-06
Confocal Raman microscopy and AFM characterises paper during manufacture
Quality Management and Production Control in Paper Manufacturing
Quality Management and Production Control in Paper Manufacturing
Confocal Raman Imaging and co..
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Brand: WITec
Model: Application-Multiple-05
Characterising crystallinity, topography, stress and other properties
Raman Imaging of Semiconducting Materials
Raman Imaging of Semiconducting Materials
Measuring semiconductors like silicon, gallium nitride or molybdenum disulph..
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Brand: Lyncee Tec
Model: Application-Materials-05
Capturing the topography of a surface in a few microseconds
Roughness measurements with Digital Holographic Microscopy
Roughness measurements with Digital Holographic Microscopy
Surface roughness measurements are typically conduct..
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Brand: WITec
Model: Application-Multiple-03
Analysing the stress field around a Vickers indent using Raman imaging and AFM
Stress in Si: Combining Confocal Raman and Atomic Force Microscopy
Stress in Si: Combining Confocal Raman and Atomic Force Microscopy
In this study, th..
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