Optics and Thin Film Applications

Carrier concentration analysis in photovoltaics, thermoelectrics and similar using the AC Field Hall Effect   AC Field Hall Effect Measurement    AC Field Hall Effect MeasurementTraditional Hall effect measurement metho..

Revealing optical information, chemical compound distribution, crystallinity, and stress within photovoltaics   Analysing Solar Cell Material Properties with Confocal Raman Imaging    Analysing Solar Cell Material Properties with Confocal Ra..

Large area shape and aberration coefficients, surface roughness and 3D topography instantly   Charaterisation of Micro Optics    Characterisation of Micro OpticsNon-contact methods for characterisation and performance of microlenses..

Raman technique reveals the molecular characteristics of 2D materials   Correlative Confocal Raman Microscopy for 2D Materials Investigation    Correlative Confocal Raman Microscopy for 2D Materials InvestigationConfocal Raman imagi..

Investigating the static and dynamic characteristics of a micro-mirror   Dynamic characterisation of MEMS and MOEMS    Dynamic characterisation of MEMS and MOEMSMEMS and MOEMS developments often require interferometric resolution of..

Revealing changes in lattice structures due to strain   High-Resolution 3D Confocal Raman Imaging for Group III Nitrides    High-Resolution 3D Confocal Raman Imaging for Group III NitridesStructured substrates are widely employed in..

Best practices to ensure optimal measurment performance   Return loss referencing using the EXFO CTP10 test platform    Return loss referencing using the EXFO CTP10 test platformThis application note discusses in more detail the refer..

Spectral testing fundamentals for complex optical transmitter sources   Spectral testing of active systems in lab and manufacturing environments    Spectral testing of active systems in lab and manufacturing environmentsThis white pap..

Analysing the stress field around a Vickers indent using Raman imaging and AFM   Stress in Si: Combining Confocal Raman and Atomic Force Microscopy    Stress in Si: Combining Confocal Raman and Atomic Force MicroscopyIn this study, ..

Studying µEL and µPL to measure LED luminescence decay spectrally and spatially   Time resolved photoluminescence studies of blue LEDs    Time resolved photoluminescence studies of blue LEDsSpatially resolved electro- and photo-lumine..

Investigating 'both-sides-structured' samples   Use of immersion liquids in Digital Holographic Microscopy    Use of immersion liquids in Digital Holographic MicroscopyIn this paper, the investigation in transmission mode of high as..

Measuring channel power, channel central wavelength and optical signal-to-noise ratio KPIs   Why OSAs are a better choice for spectral analysis than optical channel monitors    Why OSAs are a better choice for spectral analysis than optical ..