A. Application Notes and White Papers - Material Scientists
Application Notes and White Papers
This category will help you to identify which of our product/manufacturer solutions will best meet your Material Science requirements.
Integrated solutions enable researchers to measure the combined electrical, thermal and mechanical properties of materials. Testing over a wide temperature range of -268 to >1200° C is simplified using PC software with integrated temperature control facilities. Remote-controlled furnaces and cryostats with purpose designed sample holders simplify testing of solids, liquids and powders. Materials can also be tested in specialized atmospheric conditions with use of single or dual gases for fuel cell, solid oxide and super ionic conductor applications.
Impedance Characterization of Photovoltaic Cells using Solartron Instrumentation
Electrical Characterization - OLED’s Solartron Instrumentation
Introduction to the Solartron ModuLab MTS Platform
For Solartron Analytical Brochures, click documents to view and download.
Solartron Materials Lab XM
ModuLab XM ECS PhotoEchem XM
|Basics of Corrosion Measurements||212.46KiB||Download|
|Electrochemistry and Corrosion: Overview and Techniques||369.23KiB||Download|
|Material Lab - XM brochure||4.45MiB||Download|
|Material Test - Cryostat System||270.99KiB||Download|
|Material Test - High Temperature Test Systems||158.74KiB||Download|
|ModuLab XM - Dielectric Materials||1.2MiB||Download|
|ModuLab XM - Electronic Materials||1.24MiB||Download|
|ModuLab XM - Photoelectrochemical Measurement System||932.54KiB||Download|
|ModuLab XM Difference Brochure||6.42MiB||Download|
|SolarLab XM Brochure||4.95MiB||Download|